Topics studied include: CMOS VLSI Design, short channel effects, fundamentals of power dissipation in microelectronic devices, leakage or static power, leakage mechanisms (sub-threshold leakage, gate leakage etc.), CMOS leakage reduction techniques such as transistor stacking, input vector control, VTCMOS, DTMOS schemes interconnect design, Synopsys HSpice simulation, Soft errors in advanced computer systems, soft error mechanisms, error rate, soft error mitigation methodologies, and impact of Power optimizations on chip reliability The course also covers soft errors in VLSI and studies the reliability of low power circuits. This introductory course covers the design of low-power circuitry in deep submicron technologies. The power consumption is one of the most important challenges of high-performance chips and portable devices. ELEN 5301/6301/4304 Low Power CMOS Design and Reliability (Fall semester)
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